SCOUT
 
 

Our high quality silicon AFM probes are manufactured to the tightest dimensional tolerances available in the market, offering minimal variation in spring constant and resonant frequency.

Scout 350
Pack of 10 general purpose AC mode silicon AFM probes, suitable for non-contact/tapping modes in air, on hard samples and stable softer samples.

Scout 350 HAR
Pack of 10 AC mode silicon AFM probes with a high aspect ratio tip. Ideal for deep trench imaging with non-contact/tapping modes in air, on hard samples and stable softer samples.

Scout 350 T
Pack of 10 low resolution versions of our general purpose AC mode silicon AFM probes, suitable for non-contact/tapping modes in air, on hard samples and stable softer samples. Ideal for step height measurements and training new users, where price is more important than tip sharpness.

Scout 70
Pack of 10 general purpose AC mode silicon AFM probes, suitable for non-contact/soft tapping and force modulation modes in air, on softer samples.

Scout 70 HAR
Pack of 10 general purpose AC mode silicon AFM probes with a high aspect ratio tip. Ideal for deep trench imaging with non-contact/soft tapping and force modulation modes in air, on softer samples.

Scout 70 T
Pack of 10 general purpose AC mode silicon AFM probes, suitable for non-contact/soft tapping and force modulation modes in air, on softer samples. Ideal for step height measurements and training new users, where price is more important than tip sharpness.

 
 
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SPARK
 
 

Spark 350 Pt

Pack of 10 conductive AFM probes with platinum coating on both sides, suitable for electrical characterisation in AC modes (non-contact/tapping).

40 nm platinum coating with a 5nm titanium adhesion layer on both sides of the probe and a tip radius of less than 30 nm.

Spark 70 Pt

Pack of 10 conductive AFM probes with platinum coating on both sides, suitable for electrical characterisation in both contact mode and AC modes (non-contact/soft-tapping).

40 nm platinum coating with a 5nm titanium adhesion layer on both sides of the probe and a tip radius of less than 30 nm.

 
 
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NUVOC
 
 

Our NuVOC range of probes redefines the term soft cantilever in the world of force microscopy. Made from super-low-stress silicon nitride, these tip-less probes have spring constants in the range 0.003 ? 6000 pN/nm.

Our NuVOC range consist of probes with a variety of cantilever lengths on the same chip, as well as probes with arrays of 10 identical cantilevers. These probes are fabricated from super-low-stress (non-stoichiometric) silicon nitride films on a standard silicon chip. At present we work with silicon nitride thicknesses of 50, 100 and 200 nm, but can tailor this to meet our customer’s requirements.

These probes are not suitable for use in conventional AFM systems. Instead they are operated in a vertical orientation in instruments (typically developmental systems) capable of detecting lateral or shear forces acting on the cantilever. In this orientation, much more sensitive cantilevers can be used, since the cantilevers do not experience jump-to-contact events associated with low-spring constant cantilevers operated on conventional AFM instruments.

If you’d like to know more about the unique benefits of these probes and the instruments they operate with please get in touch.

NuVOC Select 50

Ultra-soft tip-less silicon nitride probes for vertical probe applications (e.g. shear force, TDFM). Probe has three cantilevers protruding from each end of the chip with differing lengths. Silicon nitride thickness is 50 nm.

NuVOC Select 100

Ultra-soft tip-less silicon nitride probes for vertical probe applications (e.g. shear force, TDFM). Probe has three cantilevers protruding from each end of the chip with differing lengths. Silicon nitride thickness is 100 nm.

NuVOC Select 200

Ultra-soft tip-less silicon nitride probes for vertical probe applications (e.g. shear force, TDFM). Probe has three cantilevers protruding from each end of the chip with differing lengths. Silicon nitride thickness is 200 nm.

 
 
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